| Display title | Semiconductor characterization techniques |
| Default sort key | Semiconductor characterization techniques |
| Page length (in bytes) | 3,274 |
| Namespace ID | 0 |
| Page ID | 25174131 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of page watchers | Fewer than 30 watchers |
| Number of redirects to this page | 1 |
| Counted as a content page | Yes |
| Wikidata item ID | Q7449391 |
| Local description | Experimental techniques to characterize semiconductor devices and materials |
| Central description | experimental techniques to characterize semiconductor devices and materials |
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| Page creator | OrganicSolar (talk | contribs) |
| Date of page creation | 06:48, 23 November 2009 |
| Latest editor | Comp.arch (talk | contribs) |
| Date of latest edit | 12:13, 20 September 2024 |
| Total number of edits | 31 |
| Recent number of edits (within past 30 days) | 0 |
| Recent number of distinct authors | 0 |
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