Dr. Yoshihiro Ohno
NIST Fellow at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (17)

Proceedings Article | 27 May 2011 Paper
A. Keppens, Y. Zong, V. Podobedov, M. Nadal, P. Hanselaer, Y. Ohno
Proceedings Volume 8082, 808241 (2011) https://doi.org/10.1117/12.889382
KEYWORDS: Luminescence, Integrating spheres, Optical spheres, Light emitting diodes, Light sources, Goniophotometry, Reflectivity, Lamps, Calibration, Error analysis

SPIE Journal Paper | 1 March 2010
OE, Vol. 49, Issue 03, 033602, (March 2010) https://doi.org/10.1117/12.10.1117/1.3360335
KEYWORDS: Light emitting diodes, Light sources, RGB color model, Lamps, Reflectivity, Colorimetry, Optical engineering, Light sources and illumination, Color difference, Visualization

Proceedings Article | 18 August 2009 Paper
Proceedings Volume 7422, 742208 (2009) https://doi.org/10.1117/12.826743
KEYWORDS: Light emitting diodes, Temperature metrology, Solid state lighting, Resistance, Optical testing, Product engineering, Reliability, Thermography, Stars, Power supplies

Proceedings Article | 10 February 2006 Paper
Proceedings Volume 6046, 604625 (2006) https://doi.org/10.1117/12.674617
KEYWORDS: Light emitting diodes, Solid state lighting, Calibration, Luminous efficacy, Light sources and illumination, Light sources, Photometry, Lamps, General lighting, RGB color model

SPIE Journal Paper | 1 November 2005
OE, Vol. 44, Issue 11, 111309, (November 2005) https://doi.org/10.1117/12.10.1117/1.2127952
KEYWORDS: Light emitting diodes, Calibration, LCDs, Photometry, Light sources, Lamps, Optical engineering, CRTs, Optimization (mathematics), Detection and tracking algorithms

Showing 5 of 17 publications
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