Electron Energy-Loss Spectroscopy principle

R. E Egerton. Electron Energy Loss Spectroscopy in the Electron Microscope. Plenum, New York, 1986. The principle textbook on EELS. [Pg.173]

Experimental data can be obtained by ultra-violet absorption spectroscopy, electron energy loss spectroscopy and photoelectron spectroscopy. UV absorption and EELs have been described briefly in Chapter 3. The former provides information only about the band-gap, while EELs gives more general information about the conduction bands. Both X-rays and UV photons can be used to generate photoelectrons these two methods are given the acronyms XPS and UPS. The energy spectrum of the emitted electrons provides information about the density of electron states in the valence bands. In principle the size of the band gap can be obtained, but care must be taken as the absolute energy... [Pg.143]

The electronic state calculation by discrete variational (DV) Xa molecular orbital method is introduced to demonstrate the usefulness for theoretical analysis of electron and x-ray spectroscopies, as well as electron energy loss spectroscopy. For the evaluation of peak energy. Slater s transition state calculation is very efficient to include the orbital relaxation effect. The effects of spin polarization and of relativity are argued and are shown to be important in some cases. For the estimation of peak intensity, the first-principles calculation of dipole transition probability can easily be performed by the use of DV numerical integration scheme, to provide very good correspondence with experiment. The total density of states (DOS) or partial DOS is also useful for a rough estimation of the peak intensity. In addition, it is necessary lo use the realistic model cluster for the quantitative analysis. The... [Pg.1]

Tompkins (1978) concentrates on the fundamental and experimental aspects of the chemisorption of gases on metals. The book covers techniques for the preparation and maintenance of clean metal surfaces, the basic principles of the adsorption process, thermal accommodation and molecular beam scattering, desorption phenomena, adsorption isotherms, heats of chemisorption, thermodynamics of chemisorption, statistical thermodynamics of adsorption, electronic theory of metals, electronic theory of metal surfaces, perturbation of surface electronic properties by chemisorption, low energy electron diffraction (LEED), infra-red spectroscopy of chemisorbed molecules, field emmission microscopy, field ion microscopy, mobility of species, electron impact auger spectroscopy. X-ray and ultra-violet photoelectron spectroscopy, ion neutralization spectroscopy, electron energy loss spectroscopy, appearance potential spectroscopy, electronic properties of adsorbed layers. [Pg.281]

Fig. 4. Schematic representation of the principle of the different core level spectroscopies. Lower part (See caption of fig. 3.) (a) and (b) SXE soft X-ray emission, (a) and (c) AES Auger electron spectroscopy, (d) XPS X-ray photoemission spectroscopy, (e) SXA soft X-ray absorption, (f) EELS electron energy loss spectroscopy. Upper part (See caption of fig. 3.) Half-filled rectangle excited final state with the same electron count as in the initial state, (e), (f). Divided rectangle final state with two electrons less than in the initial state (see also fig. 19b).

Joy, D.C., 1979, The basic principles of electron energy loss spectroscopy, in Introduction to Anal ical Electron Microscopy, eds J.J. Hren, J.I. Goldstein and D.C. Joy (Plenum Press, New York) ch. 7. [Pg.597]

While the spatial resolution of AES, XPS and SIMS continues to improve, atomic scale analysis can only be obtained by transmission electron microscopy (TEM), combined with energy dispersive X-ray spectroscopy (EDX) or electron energy loss spectroscopy (EELS). EDX detects X-rays characteristic of the elements present and EELS probes electrons which lose energy due to their interaction with the specimen. The energy losses are characteristic of both the elements present and their chemistry. Reflection high-energy electron diffraction (RHEED) provides information on surface slmcture and crystallinity. Further details of the principles of AES, XPS, SIMS and other techniques can be found in a recent publication [1]. This chapter includes the use of AES, XPS, SIMS, RHEED and TEM to study the composition of oxides on nickel, chromia and alumina formers, silicon, gallium arsenide, indium phosphide and indium aluminum phosphide. Details of the instrumentation can be found in previous reviews [2-4]. [Pg.60]

Further investigations are needed to better understand the mechanism(s) of Li storage in nanostructured metals, including theoretical quantum chemistry first principles, methods, and local probes tools such as electron transmission microscopy, X-ray photoelectron spectroscopy, and electron energy loss spectrometry. [Pg.221]

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