Carrier minority

In n type semiconductors, electrons are tire majority carriers. Holes will also be present tlirough accidental incoriioration of acceptor impurities or, more importantly, tlirough tlie intentional creation of electron-hole pairs. Holes in n type and electrons in p type semiconductors are minority carriers. [Pg.2883]

There are many ways of increasing tlie equilibrium carrier population of a semiconductor. Most often tliis is done by generating electron-hole pairs as, for instance, in tlie process of absorjition of a photon witli h E. Under reasonable levels of illumination and doping, tlie generation of electron-hole pairs affects primarily the minority carrier density. However, tlie excess population of minority carriers is not stable it gradually disappears tlirough a variety of recombination processes in which an electron in tlie CB fills a hole in a VB. The excess energy E is released as a photon or phonons. The foniier case corresponds to a radiative recombination process, tlie latter to a non-radiative one. The radiative processes only rarely involve direct recombination across tlie gap. Usually, tliis type of process is assisted by shallow defects (impurities). Non-radiative recombination involves a defect-related deep level at which a carrier is trapped first, and a second transition is needed to complete tlie process. [Pg.2883]

Radiative recombination of minority carriers is tlie most likely process in direct gap semiconductors. Since tlie carriers at tlie CB minimum and tlie VB maximum have tlie same momentum, very fast recombination can occur. The radiative recombination lifetimes in direct semiconductors are tlius very short, of tlie order of tlie ns. The presence of deep-level defects opens up a non-radiative recombination patli and furtlier shortens tlie carrier lifetime. [Pg.2883]

The situation is very different in indirect gap materials where phonons must be involved to conserve momentum. Radiative recombination is inefficient, resulting in long lifetimes. The minority carrier lifetimes in Si reach many ms, again in tire absence of defects. It should be noted tliat long minority carrier lifetimes imply long diffusion lengtlis. Minority carrier lifetime can be used as a convenient quality benchmark of a semiconductor. [Pg.2884]

Figure C2.16.7. A schematic energy band diagram of a p-n junction witliout external bias (a) and under forward bias (b). Electrons and holes are indicated witli - and + signs, respectively. It should be remembered tliat tlie energy of electrons increases by moving up, holes by moving down. Electrons injected into tlie p side of tlie junction become minority carriers. Approximate positions of donor and acceptor levels and tlie Feniii level, are indicated.

Light is generated in semiconductors in the process of radiative recombination. In a direct semiconductor, minority carrier population created by injection in a forward biased p-n junction can recombine radiatively, generating photons with energy about equal to E. The recombination process is spontaneous, individual electron-hole recombination events are random and not related to each other. This process is the basis of LEDs [36]. [Pg.2890]

The bipolar junction transistor (BIT) consists of tliree layers doped n-p-n or p-n-p tliat constitute tire emitter, base and collector, respectively. This stmcture can be considered as two back-to-back p-n junctions. Under nonnal operation, tire emitter-base junction is forward biased to inject minority carriers into tire base region. For example, tire n type emitter injects electrons into a p type base. The electrons in tire base, now minority carriers, diffuse tlirough tire base layer. The base-collector junction is reverse biased and its electric field sweeps tire carriers diffusing tlirough tlie base into tlie collector. The BIT operates by transport of minority carriers, but botli electrons and holes contribute to tlie overall current. [Pg.2891]

AE at the n-p heterointerface which prevents their injection into the n region. The result is that the injected minority carriers are confined to the thin narrow-bandgap region. If this region is thinner than the average diffusion... [Pg.2893]

Germanium single crystals intended for electronic apphcations are usuaHy specified according to conductivity type, dopant, resistivity, orientation, and maximum dislocation density. They may be specified to be lineage-free unless the specified resistivity is below about 0.05 H-cm. Minority carrier lifetime and majority carrier mobHity are occasionaHy specified. [Pg.280]

The impurity atoms used to form the p—n junction form well-defined energy levels within the band gap. These levels are shallow in the sense that the donor levels He close to the conduction band (Fig. lb) and the acceptor levels are close to the valence band (Fig. Ic). The thermal energy at room temperature is large enough for most of the dopant atoms contributing to the impurity levels to become ionized. Thus, in the -type region, some electrons in the valence band have sufficient thermal energy to be excited into the acceptor level and leave mobile holes in the valence band. Similar excitation occurs for electrons from the donor to conduction bands of the n-ty e material. The electrons in the conduction band of the n-ty e semiconductor and the holes in the valence band of the -type semiconductor are called majority carriers. Likewise, holes in the -type, and electrons in the -type semiconductor are called minority carriers. [Pg.126]

Under Httle or no illumination,/ must be minimized for optimum performance. The factor B is 1.0 for pure diffusion current and approaches 2.0 as depletion and surface-mode currents become important. Generally, high crystal quality for long minority carrier lifetime and low surface-state density reduce the dark current density which is the sum of the diffusion, depletion, tunneling, and surface currents. The ZM product is typically measured at zero bias and is expressed as RM. The ideal photodiode noise current can be expressed as follows ... [Pg.426]

For a weU-designed, weU-made HgCdTe photoconductoi detector (76,77), g-r noise is dominant and may be expressed in terms of a minority carrier densityp and majority carrier density n. Semiconductor noise analysis for the HgCdTe photoconductor yields,... [Pg.434]

The responsivity and g-r noise may be analyzed to obtain background photon flux and temperature dependence of responsivity, noise, and detectivity. Typically, n > p, and both ate determined by shallow impurity levels. The minority carrier density is the sum of thermal and optical contributions. [Pg.434]

When sunlight falls on a p—n junction solar cell while it is short-circuited, the magnitude of remains essentially the same as it was in darkness. Because the diffusion of majority current only varies with lA, the majority current does not change. However, additional minority carriers are formed by... [Pg.468]

The equihbtium lever relation, np = can be regarded from a chemical kinetics perspective as the result of a balance between the generation and recombination of electrons and holes (21). In extrinsic semiconductors recombination is assisted by chemical defects, such as transition metals, which introduce new energy levels in the energy gap. The recombination rate in extrinsic semiconductors is limited by the lifetime of minority carriers which, according to the equihbtium lever relation, have much lower concentrations than majority carriers. Thus, for a -type semiconductor where electrons are the minority carrier, the recombination rate is /S n/z. An = n — is the increase of the electron concentration over its value in thermal equihbtium, and... [Pg.346]

When electrons are injected as minority carriers into a -type semiconductor they may diffuse, drift, or disappear. That is, their electrical behavior is determined by diffusion in concentration gradients, drift in electric fields (potential gradients), or disappearance through recombination with majority carrier holes. Thus, the transport behavior of minority carriers can be described by a continuity equation. To derive the p—n junction equation, steady-state is assumed, so that = 0, and a neutral region outside the depletion region is assumed, so that the electric field is zero. Under these circumstances,... [Pg.349]

Lp = D r ) is the minority carrier diffusion length for electrons in the -region, (0) is the minority carrier concentration at the boundary between the depletion layer and the neutral region. The sign of this equation indicates that electron injection into the -region results in a positive current flow from p to n a.s shown in Figure 7. [Pg.349]

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