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Substrate/surface characterization atomic Force Microscope

The smface roughness of etalon samples, glass substrates and polymer replicas were investigated with Solver atomic-force microscopes (NT MDT company, Zelenograd, Russia). The AFM measurements data were used to construct dependence of the rms roughness o on a frame size, which characterizes the surface roughness on a varying scale. [Pg.492]

See other pages where Substrate/surface characterization atomic Force Microscope is mentioned: [Pg.438] [Pg.55] [Pg.228] [Pg.3121] [Pg.319] [Pg.1936] [Pg.10] [Pg.69] [Pg.512] [Pg.233] [Pg.512] [Pg.861] [Pg.750] [Pg.152] [Pg.141] [Pg.328] [Pg.19]

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Atomic Force Microscope

Atomic substrates

Atoms characterizing

Force microscope

Microscopic forces

Substrate characterization

Substrate surface

Substrate/surface characterization

Surface atoms

Surface forces