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ORCIDPeter C. Maxwell
Person information
- affiliation: ON Semiconductor, USA
- affiliation: Aptina Imaging, San Jose, CA, USA
- affiliation: Micron Technology Inc., USA
- affiliation: Agilent Technologies, Santa Clara, CA, USA
- affiliation: Hewlett-Packard Company, Santa Clara, CA, USA
- affiliation: University of New South Wales, Sydney, NSW, Australia
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2020 – today
- 2021
[j12]Friedrich Hapke
, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski:
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(3): 584-597 (2021)
2010 – 2019
- 2018
- [c33]Friedrich Hapke, Peter C. Maxwell:
Total Critical Area Based Testing. ITC 2018: 1-10 - 2017
- [c32]Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh:
Bridge over troubled waters: Critical area based pattern generation. ETS 2017: 1-6 - 2016
- [c31]Peter C. Maxwell, Friedrich Hapke, Huaxing Tang:
Cell-aware diagnosis: Defective inmates exposed in their cells. ETS 2016: 1-6 - [c30]Hans-Joachim Wunderlich, Peter C. Maxwell:
ETS 2015 best paper. ETS 2016: 1 - 2012
- [c29]Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell:
Adaptive testing: Conquering process variations. ETS 2012: 1-6 - 2011
- [j11]Peter C. Maxwell:
Adaptive Testing: Dealing with Process Variability. IEEE Des. Test Comput. 28(6): 41-49 (2011) - [c28]Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell:
Towards Variation-Aware Test Methods. ETS 2011: 219-225 - 2010
- [c27]Peter C. Maxwell:
Adaptive test directions. ETS 2010: 12-16
2000 – 2009
- 2007
- [c26]Peter C. Maxwell:
Wafer Level Reliability Screens. ETS 2007: 201 - [c25]Peter C. Maxwell:
Principles and results of some test cost reduction methods for ASICs. ITC 2007: 1-5 - 2006
- [c24]Peter C. Maxwell:
The Design, Implementation and Analysis of Test Experiments. ITC 2006: 1-9 - 2003
- [j10]Peter C. Maxwell:
Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. IEEE Des. Test Comput. 20(5): 84-89 (2003) - 2002
- [j9]Jaume Segura, Peter C. Maxwell:
Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era. IEEE Des. Test Comput. 19(5): 5-7 (2002) - [c23]Peter C. Maxwell:
The Heisenberg Uncertainty of Test. ITC 2002: 13 - [c22]Peter C. Maxwell:
Wafer/Package Test Mix for Optimal Defect Detection. ITC 2002: 1050-1055 - [c21]Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers:
Debating the Future of Burn-In. VTS 2002: 311-314 - 2000
- [c20]Peter C. Maxwell, Ismed Hartanto, Lee Bentz:
Comparing functional and structural tests. ITC 2000: 400-407 - [c19]Peter C. Maxwell, Jeff Rearick:
Deception by design: fooling ourselves with gate-level models. ITC 2000: 921-929 - [c18]Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman:
Current ratios: a self-scaling technique for production IDDQ testing. ITC 2000: 1148-1156
1990 – 1999
- 1999
- [c17]Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman:
Current ratios: a self-scaling technique for production I_DDQ testing. ITC 1999: 738-746 - 1998
- [c16]Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell:
CMOS IC reliability indicators and burn-in economics. ITC 1998: 194-203 - [c15]Peter C. Maxwell, Jeff Rearick:
Estimation of defect-free IDDQ in submicron circuits using switch level simulation. ITC 1998: 882-889 - [c14]Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh:
Best Methods for At-Speed Testing? VTS 1998: 460-461 - 1997
- [c13]Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly:
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038 - [c12]Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken:
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459 - 1996
- [c11]Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown:
IDDQ and AC Scan: The War Against Unmodelled Defects. ITC 1996: 250-258 - 1995
- [j8]Peter C. Maxwell:
Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5): 603-607 (1995) - [c10]Peter C. Maxwell:
The Many Faces of Test Synthesis. ITC 1995: 295 - [c9]Peter C. Maxwell:
The use of IDDQ testing in low stuck-at coverage situations. VTS 1995: 84-88 - 1994
- [c8]Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman:
The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. ITC 1994: 739-746 - [c7]Peter C. Maxwell:
Quality impacts of non-uniform fault coverage. VTS 1994: 197-200 - 1993
- [j7]Peter C. Maxwell, Robert C. Aitken:
Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. IEEE Des. Test Comput. 10(1): 42-51 (1993) - [c6]Peter C. Maxwell, Robert C. Aitken:
Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. ITC 1993: 63-72 - [c5]Peter C. Maxwell:
Let's Grade ALL the Faults. ITC 1993: 595 - 1992
- [j6]Peter C. Maxwell, Robert C. Aitken:
IDDQ testing as a component of a test suite: The need for several fault coverage metrics. J. Electron. Test. 3(4): 305-316 (1992) - [c4]Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang:
The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? ITC 1992: 168-177 - 1991
- [c3]Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang:
The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? ITC 1991: 358-364 - [c2]Peter C. Maxwell:
The Interaction of Test and Quality. ITC 1991: 1120 - 1990
- [c1]Peter C. Maxwell, Hans-Joachim Wunderlich:
The effectiveness of different test sets for PLAs. EURO-DAC 1990: 628-632
1980 – 1989
- 1988
- [j5]Peter C. Maxwell:
Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers. IEEE Trans. Computers 37(11): 1411-1414 (1988)
1970 – 1979
- 1978
- [j4]Philip G. McCrea, Peter C. Maxwell, Paul W. Baker:
Comments on "A Floating Point Multiplexed DDA System". IEEE Trans. Computers 27(12): 1226 (1978) - 1977
- [j3]Peter C. Maxwell:
Correct DDA Register Transfers for Trapezoidal Integration When Solving Nonlinear Equations of the Form y = A yn. IEEE Trans. Computers 26(11): 1151-1153 (1977) - 1976
- [j2]Peter C. Maxwell, Paul W. Baker, Philip G. McCrea:
Incremental Computer Systems. Aust. Comput. J. 8(3): 97-102 (1976) - 1974
- [j1]Peter C. Maxwell:
Alternative Descriptions in Line Drawing Analysis. Artif. Intell. 5(4): 325-348 (1974)
Coauthor Index
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