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2000 – 2009
- 2005
[c8]Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
Electric field for detecting open leads in CMOS logic circuits by supply current testing. ISCAS (3) 2005: 2995-2998- 2004
- [j1]Masahiro Ichimiya, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
A test circuit for pin shorts generating oscillation in CMOS logic circuits. Syst. Comput. Jpn. 35(13): 10-20 (2004) - 2002
- [c7]Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada:
Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. DELTA 2002: 387-391 - 2001
- [c6]Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita:
IDDQ Sensing Technique for High Speed IDDQ Testing. Asian Test Symposium 2001: 111-116 - [c5]Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. Asian Test Symposium 2001: 117-122 - [c4]Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
CMOS open defect detection by supply current test. DATE 2001: 509 - [c3]Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada:
Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. DFT 2001: 287- - 2000
- [c2]Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda:
High speed IDDQ test and its testability for process variation. Asian Test Symposium 2000: 344-349
1990 – 1999
- 1998
- [c1]Masaki Hashizume, Yukiya Miura, Masahiro Ichimiya, Takeomi Tamesada, Kozo Kinoshita:
A High-Speed IDDQ Sensor for Low-Voltage ICs. Asian Test Symposium 1998: 327-
Coauthor Index
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