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2020 – today
- 2023
[j3]Nektar Xama
, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(10): 3426-3435 (2023)- [c7]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. ETS 2023: 1-4 - 2022
- [j2]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4771-4781 (2022) - [c6]Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu:
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS 2022: 1-10 - 2020
- [j1]Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst. 25(5): 47:1-47:27 (2020) - [c5]Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. ETS 2020: 1-6 - [c4]Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. ETS 2020: 1-6 - [c3]Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ITC 2020: 1-10 - [c2]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. VTS 2020: 1-6
2010 – 2019
- 2019
- [c1]Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. ITC 2019: 1-4
Coauthor Index
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