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ORCIDFlorian Klemme
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2020 – today
- 2024
[j9]Rodion Novkin
, Florian Klemme, Hussam Amrouch:
Approximation- and Quantization-Aware Training for Graph Neural Networks. IEEE Trans. Computers 73(2): 599-612 (2024)- [c19]Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. ETS 2024: 1-6 - [c18]Hussam Amrouch, Victor M. van Santen, Javier Diaz-Fortuny, Florian Klemme:
Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper). IRPS 2024: 1-8 - [c17]Anirban Kar, Florian Klemme, Yogesh Singh Chauhan, Hussam Amrouch:
On the Severity of Self-Heating in FDSOI at Cryogenic Temperatures: In-depth Analysis from Transistors to Full Processor. IRPS 2024: 1-6 - [c16]Benjamin Hien, Marcel Walter, Victor M. van Santen, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch, Robert Wille:
Technology Mapping for Cryogenic CMOS Circuits. ISVLSI 2024: 272-277 - [c15]Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
Vmin Testing under Variations: Defect vs. Fault Coverage. LATS 2024: 1-6 - [i2]Konstantinos Balaskas, Florian Klemme, Georgios Zervakis, Kostas Siozios, Hussam Amrouch, Jörg Henkel:
Variability-Aware Approximate Circuit Synthesis via Genetic Optimization. CoRR abs/2404.04258 (2024) - 2023
- [j8]Florian Klemme, Hussam Amrouch:
Transistor Self-Heating-Aware Synthesis for Reliable Digital Circuit Designs. IEEE Trans. Circuits Syst. I Regul. Pap. 70(12): 5366-5379 (2023) - [c14]Hussam Amrouch, Florian Klemme:
ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors All the Way up Processors. ASP-DAC 2023: 76-82 - [c13]Victor M. van Santen, Marcel Walter, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Robert Wille, Hussam Amrouch:
Design Automation for Cryogenic CMOS Circuits. DAC 2023: 1-6 - [c12]Florian Klemme, Sami Salamin, Hussam Amrouch:
Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows. DATE 2023: 1-6 - [c11]Zahra Paria Najafi-Haghi, Florian Klemme, Hanieh Jafarzadeh, Hussam Amrouch, Hans-Joachim Wunderlich:
Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. DATE 2023: 1-2 - [c10]Behnaz Ranjbar, Florian Klemme, Paul R. Genssler, Hussam Amrouch, Jinhyo Jung, Shail Dave, Hwisoo So, Kyongwoo Lee, Aviral Shrivastava, Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Francky Catthoor, Dwaipayan Biswas, Akash Kumar:
Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level. DATE 2023: 1-10 - [c9]Victor M. van Santen, Florian Klemme, Paul R. Genssler, Hussam Amrouch:
Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. DFT 2023: 1-6 - [c8]Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
Robust Pattern Generation for Small Delay Faults Under Process Variations. ITC 2023: 111-116 - [c7]Yuting Hu, Jiajie Li, Florian Klemme, Gi-Joon Nam, Tengfei Ma, Hussam Amrouch, Jinjun Xiong:
SyncTREE: Fast Timing Analysis for Integrated Circuit Design through a Physics-informed Tree-based Graph Neural Network. NeurIPS 2023 - 2022
- [j7]Sami Salamin, Georgios Zervakis, Florian Klemme, Hammam Kattan, Yogesh Singh Chauhan, Jörg Henkel, Hussam Amrouch:
Impact of NCFET Technology on Eliminating the Cooling Cost and Boosting the Efficiency of Google TPU. IEEE Trans. Computers 71(4): 906-918 (2022) - [j6]Lilas Alrahis, Johann Knechtel, Florian Klemme, Hussam Amrouch, Ozgur Sinanoglu:
GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 3826-3837 (2022) - [j5]Florian Klemme, Hussam Amrouch:
Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency. IEEE Trans. Circuits Syst. I Regul. Pap. 69(5): 2142-2155 (2022) - [j4]Konstantinos Balaskas, Florian Klemme, Georgios Zervakis, Kostas Siozios, Hussam Amrouch, Jörg Henkel:
Variability-Aware Approximate Circuit Synthesis via Genetic Optimization. IEEE Trans. Circuits Syst. I Regul. Pap. 69(10): 4141-4153 (2022) - [j3]Florian Klemme, Hussam Amrouch:
Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries. IEEE Trans. Circuits Syst. I Regul. Pap. 69(12): 5233-5246 (2022) - [c6]Hussam Amrouch, Florian Klemme, Paul R. Genssler:
Design Close to the Edge for Advanced Technology using Machine Learning and Brain-Inspired Algorithms. ASP-DAC 2022: 493-499 - [c5]Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphaël Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann:
Intelligent Methods for Test and Reliability. DATE 2022: 969-974 - [c4]Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich:
On Extracting Reliability Information from Speed Binning. ETS 2022: 1-4 - [i1]Lilas Alrahis, Johann Knechtel, Florian Klemme, Hussam Amrouch, Ozgur Sinanoglu:
GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation. CoRR abs/2208.02868 (2022) - 2021
- [j2]Florian Klemme, Hussam Amrouch:
Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization. IEEE Trans. Circuits Syst. I Regul. Pap. 68(6): 2569-2579 (2021) - [c3]Florian Klemme, Hussam Amrouch:
Machine Learning for Circuit Aging Estimation under Workload Dependency. ITC 2021: 37-46 - 2020
- [j1]Hussam Amrouch, Girish Pahwa, Amol D. Gaidhane, Chetan K. Dabhi, Florian Klemme, Om Prakash, Yogesh Singh Chauhan:
Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(9): 3127-3137 (2020) - [c2]Florian Klemme, Jannik Prinz, Victor M. van Santen, Jörg Henkel, Hussam Amrouch:
Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities. ICCAD 2020: 15:1-15:9 - [c1]Florian Klemme, Yogesh Singh Chauhan, Jörg Henkel, Hussam Amrouch:
Cell Library Characterization using Machine Learning for Design Technology Co-Optimization. ICCAD 2020: 162:1-162:9
Coauthor Index
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last updated on 2024-10-07 21:26 CEST by the dblp team
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