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2010 – 2019
- 2010
[j6]Sunghoon Chun, Alex Orailoglu:
DiSC: A New Diagnosis Method for Multiple Scan Chain Failures. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(12): 2051-2055 (2010)
2000 – 2009
- 2009
- [j5]Sunghoon Chun, Taejin Kim, Sungho Kang:
ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(9): 1401-1413 (2009) - [c9]Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang:
A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. VTS 2009: 152-157 - 2008
- [j4]Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang:
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. J. Electron. Test. 24(6): 591-595 (2008) - [c8]Sunghoon Chun, Taejin Kim, Sungho Kang:
A new low energy BIST using a statistical code. ASP-DAC 2008: 647-652 - [c7]Sunghoon Chun, YongJoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang:
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults. ATS 2008: 83-88 - [c6]Taejin Kim, Sunghoon Chun, YongJoon Kim, Myung-Hoon Yang, Sungho Kang:
An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme. ATS 2008: 151-156 - [c5]Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang:
A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. ITC 2008: 1-10 - [c4]Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang:
An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. VTS 2008: 73-78 - 2007
- [j3]Sunghoon Chun, YongJoon Kim, Sungho Kang:
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. J. Electron. Test. 23(4): 357-362 (2007) - [c3]Sunghoon Chun, YongJoon Kim, Sungho Kang:
High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects. ATS 2007: 115-120 - 2006
- [j2]Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang:
An Efficient Dictionary Organization for Maximum Diagnosis. J. Electron. Test. 22(1): 37-48 (2006) - [j1]Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang:
MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. Very Large Scale Integr. Syst. 14(6): 649-654 (2006) - 2004
- [c2]Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang:
RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. Asian Test Symposium 2004: 242-247 - 2003
- [c1]YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang:
A New Maximal Diagnosis Algorithm for Bus-structured Systems. ITC 2003: 349-357
Coauthor Index
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