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2010 – 2019
- 2013
[c22]Luca Giancardo
, Thomas P. Karnowski, Kenneth W. Tobin, Fabrice Mériaudeau, Edward Chaum:
Validation of microaneurysm-based diabetic retinopathy screening across retina fundus datasets. CBMS 2013: 125-130- [c21]Thomas P. Karnowski, Luca Giancardo, Yaqin Li, Kenneth W. Tobin, Edward Chaum:
Retina image analysis and ocular telehealth: The oak ridge national laboratory-hamilton eye institute case study. EMBC 2013: 7140-7143 - 2012
- [j8]Luca Giancardo, Fabrice Mériaudeau, Thomas P. Karnowski, Yaqin Li, Seema Garg, Kenneth W. Tobin, Edward Chaum:
Exudate-based diabetic macular edema detection in fundus images using publicly available datasets. Medical Image Anal. 16(1): 216-226 (2012) - [c20]Vincent C. Paquit, Thomas P. Karnowski, Deniz Aykac, Yaqin Li, Kenneth W. Tobin, Edward Chaum:
Detecting flash artifacts in fundus imagery. EMBC 2012: 1442-1445 - 2011
- [j7]Luca Giancardo, Fabrice Mériaudeau, Thomas P. Karnowski, Kenneth W. Tobin, Enrico Grisan, Paolo Favaro, Alfredo Ruggeri, Edward Chaum:
Textureless Macula Swelling Detection With Multiple Retinal Fundus Images. IEEE Trans. Biomed. Eng. 58(3): 795-799 (2011) - [c19]Philip R. Bingham, Hector J. Santos-Villalobos, Kenneth W. Tobin:
Coded source neutron imaging. Image Processing: Machine Vision Applications 2011: 78770M - [c18]Luca Giancardo, Fabrice Mériaudeau, Thomas P. Karnowski, Yaqin Li, Kenneth W. Tobin, Edward Chaum:
Microaneurysm detection with radon transform-based classification on retina images. EMBC 2011: 5939-5942 - [c17]Thomas P. Karnowski, Deniz Aykac, Luca Giancardo, Yaqin Li, T. Nichols, Kenneth W. Tobin, Edward Chaum:
Automatic detection of retina disease: Robustness to image quality and localization of anatomy structure. EMBC 2011: 5959-5964 - [c16]Hector J. Santos-Villalobos, Thomas P. Karnowski, Deniz Aykac, Luca Giancardo, Yaqin Li, T. Nichols, Kenneth W. Tobin, Edward Chaum:
Statistical characterization and segmentation of drusen in fundus images. EMBC 2011: 6236-6241 - [c15]Luca Giancardo, Fabrice Mériaudeau, Thomas P. Kamowski, Yaqin Li, Kenneth W. Tobin, Edward Chaum:
Automatic quality enhancement and nerve fibre layer artefacts removal in retina fundus images by off axis imaging. ICIP 2011: 49-52 - [c14]Luca Giancardo, Fabrice Mériaudeau, Thomas P. Karnowski, Yaqin Li, Kenneth W. Tobin, Edward Chaum:
Automatic retina exudates segmentation without a manually labelled training set. ISBI 2011: 1396-1400 - 2010
- [c13]Luca Giancardo, Fabrice Mériaudeau, Thomas P. Karnowski, Kenneth W. Tobin, Yaqin Li, Edward Chaum:
Microaneurysms detection with the radon cliff operator in retinal fundus images. Medical Imaging: Image Processing 2010: 76230U
2000 – 2009
- 2009
- [c12]Fabrice Mériaudeau, Vincent C. Paquit, Nicolas Walter, Jeffery R. Price, Kenneth W. Tobin:
3D and multispectral imaging for subcutaneous veins detection. ICIP 2009: 2857-2860 - 2008
- [c11]Vincent C. Paquit, Jeffery R. Price, Fabrice Mériaudeau, Kenneth W. Tobin:
Improving light propagation Monte Carlo simulations with accurate 3D modeling of skin tissue. ICIP 2008: 2976-2979 - 2007
- [j6]Kenneth W. Tobin, Edward Chaum, V. Priya Govindasamy, Thomas P. Karnowski:
Detection of Anatomic Structures in Human Retinal Imagery. IEEE Trans. Medical Imaging 26(12): 1729-1739 (2007) - [c10]Jeffery R. Price, Timothy F. Gee, Vincent C. Paquit, Kenneth W. Tobin:
On the Efficacy of Correcting for Refractive Effects in Iris Recognition. CVPR 2007 - [c9]Vincent C. Paquit, Jeffery R. Price, Fabrice Mériaudeau, Kenneth W. Tobin, Thomas L. Ferrell:
Combining near-infrared illuminants to optimize venous imaging. Medical Imaging: Image-Guided Procedures 2007: 65090H - 2006
- [c8]Thomas P. Karnowski, V. Priya Govindasamy, Kenneth W. Tobin, Edward Chaum:
Locating the Optic Nerve in Retinal Images: Comparing Model-Based and Bayesian Decision Methods. EMBC 2006: 4436-4439 - [c7]Kenneth W. Tobin, Deniz Aykac, V. Priya Govindasamy, Shaun S. Gleason, Jens Gregor, Thomas P. Karnowski, Jeffery R. Price, Jonathan Wall:
Image-Based Informatics for Preclinical Biomedical Research. ISVC (2) 2006: 824-834 - [c6]Vincent C. Paquit, Jeffery R. Price, Ralph Seulin, Fabrice Mériaudeau, Rubye H. Farahi, Kenneth W. Tobin, Thomas L. Ferrell:
Near-infrared imaging and structured light ranging for automatic catheter insertion. Medical Imaging: Image-Guided Procedures 2006: 61411T - [c5]Kenneth W. Tobin, Edward Chaum, V. Priya Govindasamy, Thomas P. Karnowski, Omer Sezer:
Characterization of the optic disc in retinal imagery using a probabilistic approach. Medical Imaging: Image Processing 2006: 61443F - 2005
- [c4]Kenneth W. Tobin, Budhendra L. Bhaduri, Eddie A. Bright, Anil M. Cheriyadat, Thomas P. Karnowski, Paul J. Palathingal, Thomas E. Potok, Jeffery R. Price:
Large-Scale Geospatial Indexing for Image-Based Retrieval and Analysis. ISVC 2005: 543-552 - 2004
- [j5]Kenneth W. Tobin, Fabrice Mériaudeau, Luciano da Fontoura Costa:
Guest Editorial: Special Section on Quality Control by Artificial Vision. J. Electronic Imaging 13(3): 409-410 (2004) - [j4]Pierrick Bourgeat, Fabrice Mériaudeau, Kenneth W. Tobin, Patrick Gorria:
Content based segmentation of patterned wafers. J. Electronic Imaging 13(3): 428-435 (2004) - [j3]Philip R. Bingham, Jeffery R. Price, Kenneth W. Tobin, Thomas P. Karnowski:
Semiconductor sidewall shape estimation. J. Electronic Imaging 13(3): 474-485 (2004) - [c3]Pierrick Bourgeat, Fabrice Mériaudeau, Patrick Gorria, Kenneth W. Tobin, Frédéric Truchetet:
Features extraction on complex images. ICIP 2004: 219-222 - 2002
- [j2]Kenneth W. Tobin, Thomas P. Karnowski, Lloyd F. Arrowood, Regina K. Ferrell, James S. Goddard, Fred Lakhani:
Content-Based Image Retrieval for Semiconductor Process Characterization. EURASIP J. Adv. Signal Process. 2002(7): 704-713 (2002) - 2001
- [j1]Kenneth W. Tobin, John W. V. Miller:
Guest Editorial: Special Section on Machine Vision for Industrial Inspection. J. Electronic Imaging 10(1): 194-195 (2001) - [c2]Jeffery R. Price, Timothy F. Gee, Kenneth W. Tobin:
Blur estimation in limited-control environments. ICASSP 2001: 1669-1672
1990 – 1999
- 1996
- [c1]Shaun S. Gleason, Kenneth W. Tobin:
Directional dilation for the connection of piece-wise objects: a semiconductor manufacturing case study. ICIP (3) 1996: 9-12
Coauthor Index
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