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ORCIDHassan Ebrahimi
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2020 – today
- 2022
[j4]R. Sandra Schillo
, Hassan Ebrahimi:
Gender dimensions of digitalisation: a comparison of Venture Capital backed start-ups across fields. Technol. Anal. Strateg. Manag. 34(7): 733-745 (2022)- 2021
- [c11]Hassan Ebrahimi, Hans G. Kerkhoff:
Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level. DDECS 2021: 75-80 - 2020
- [c10]Hassan Ebrahimi, Hans G. Kerkhoff:
A New Monitor Insertion Algorithm for Intermittent Fault Detection. ETS 2020: 1-6
2010 – 2019
- 2019
- [j3]Hassan Ebrahimi, Hans G. Kerkhoff:
A Digital On-Line Monitor for Detecting Intermittent Resistance Faults at Board Level. J. Circuits Syst. Comput. 28(Supplement-1): 1940003:1-1940003:15 (2019) - 2018
- [c9]Hassan Ebrahimi, Hans G. Kerkhoff:
Intermittent Resistance Fault Detection at Board Level. DDECS 2018: 135-140 - [c8]Ghazanfar Ali, Hassan Ebrahimi, Jerrin Pathrose, Hans G. Kerkhoff:
Design and implementation of a dependable CPSoC for automotive applications. ICPS 2018: 246-251 - 2017
- [c7]Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Ibrahim:
An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability. ITC-Asia 2017: 65-70 - 2016
- [j2]Hans G. Kerkhoff, Hassan Ebrahimi:
Investigation of Intermittent Resistive Faults in Digital CMOS Circuits. J. Circuits Syst. Comput. 25(3): 1640023:1-1640023:17 (2016) - [c6]Hassan Ebrahimi, Alireza Rohani, Hans G. Kerkhoff:
Detecting intermittent resistive faults in digital CMOS circuits. DFT 2016: 87-90 - [c5]Hassan Ebrahimi, Hans G. Kerkhoff:
Testing for Intermittent Resistive Faults in CMOS Integrated Systems. DSD 2016: 703-707 - [c4]Alireza Rohani, Hassan Ebrahimi, Hans G. Kerkhoff:
A software framework to calculate local temperatures in CMOS processors. PATMOS 2016: 183-188 - 2015
- [c3]Hans G. Kerkhoff, Hassan Ebrahimi:
Intermittent Resistive Faults in Digital CMOS Circuits. DDECS 2015: 211-216 - 2011
- [j1]Hassan Ebrahimi, Morteza Saheb Zamani, Hamid R. Zarandi:
Mitigating soft errors in SRAM-based FPGAs by decoding configuration bits in switch boxes. Microelectron. J. 42(1): 12-20 (2011) - 2010
- [c2]Hassan Ebrahimi, Morteza Saheb Zamani, Hamid R. Zarandi:
A decoder-based switch box to mitigate soft errors in SRAM-based FPGAs. ASP-DAC 2010: 832-837 - [c1]Hassan Ebrahimi, Morteza Saheb Zamani, Seyyed Ahmad Razavi:
A Switch Box Architecture to Mitigate Bridging and Short Faults in SRAM-Based FPGAs. DFT 2010: 218-224
Coauthor Index
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