"Two-pattern test generation with low power consumption based on LFSR."

Miroslaw Puczko, V. N. Yarmolik (2005)

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DOI: 10.1007/0-387-26325-X_16

access: closed

type: Part in Book or Collection

metadata version: 2023-10-16

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Miroslaw Puczko, V. N. Yarmolik:
Two-pattern test generation with low power consumption based on LFSR. Information Processing and Security Systems 2005: 159-166

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