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"SRAMs in Scaled Technologies under Process Variations: Failure Mechanisms, ..."
Saibal Mukhopadhyay et al. (2006)
- Saibal Mukhopadhyay, Amit Agarwal, Qikai Chen, Kaushik Roy:
SRAMs in Scaled Technologies under Process Variations: Failure Mechanisms, Test & Variation Tolerant Design. CICC 2006: 547-554

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