"Scan chain clustering for test power reduction."

Melanie Elm et al. (2008)

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DOI: 10.1145/1391469.1391680

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding:
Scan chain clustering for test power reduction. DAC 2008: 828-833

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