"Accurate and Fast Testing Technique of Operational Amplifier DC Offset ..."

Yuto Sasaki et al. (2019)

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DOI: 10.1109/ITC-ASIA.2019.00014

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-21

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Yuto Sasaki, Kosuke Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion. ITC-Asia 2019: 1-6

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