"DPPM Reduction Methods and New Defect Oriented Test Methods Applied to ..."

Will Howell et al. (2018)

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DOI: 10.1109/TEST.2018.8624906

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-01

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Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski:
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC 2018: 1-10

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