"Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened ..."

Sam M.-H. Hsiao et al. (2022)

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DOI: 10.1109/ITC50671.2022.00020

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Sam M.-H. Hsiao, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen:
Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies. ITC 2022: 128-136

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