"Contactless detection of faulty TSV in 3D IC via capacitive coupling."

Iftekhar Ibne Basith, Rashid Rashidzadeh, Esam Abdel-Raheem (2015)

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DOI: 10.1109/MWSCAS.2015.7282065

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-26

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Iftekhar Ibne Basith, Rashid Rashidzadeh, Esam Abdel-Raheem:
Contactless detection of faulty TSV in 3D IC via capacitive coupling. MWSCAS 2015: 1-4

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