"Atomic Defect Identification with Sparse Sampling and Deep Learning."

Michael C. Cao et al. (2021)

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DOI: 10.1007/978-3-030-96498-6_28

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Michael C. Cao, Jonathan Schwartz, Huihuo Zheng, Yi Jiang, Robert Hovden, Yimo Han:
Atomic Defect Identification with Sparse Sampling and Deep Learning. SMC 2021: 455-463

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