"DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study."

Davide Appello et al. (2009)

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DOI: 10.1109/VTS.2009.26

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda:
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281

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