"Smart selection of indirect parameters for DC-based alternate RF IC testing."

Haithem Ayari et al. (2012)

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DOI: 10.1109/VTS.2012.6231074

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-05

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Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma:
Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS 2012: 19-24

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