"A Black-Box External Equivalent Method Using Tie-Line Power Mutation."

Wei Yan et al. (2019)

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DOI: 10.1109/ACCESS.2019.2892060

access: open

type: Journal Article

metadata version: 2019-02-15

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  - https://dblp.org/rec/journals/access/YanZTQLW19
Wei Yan, Chao Zhang, Junjie Tang, Wei Qian, Shiming Li, Qian Wang:
A Black-Box External Equivalent Method Using Tie-Line Power Mutation. IEEE Access 7: 11997-12005 (2019)

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