"Off Line, Built-in Test Techniques for VLSI Circuits."

Martin Buehler, Michael Sievers (1982)

> Home

Details and statistics

DOI: 10.1109/MC.1982.1654052

access: closed

type: Journal Article

metadata version: 2020-08-12

- view
  authority control:
- export record
  dblp key:
  - journals/computer/BuehlerS82
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/computer/BuehlerS82
Martin Buehler, Michael Sievers:
Off Line, Built-in Test Techniques for VLSI Circuits. Computer 15(6): 69-82 (1982)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.