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"Single Event Transient Propagation Probabilities Analysis for Nanometer ..."
Shuo Cai et al. (2019)
- Shuo Cai, Weizheng Wang, Fei Yu, Binyong He:
Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits. J. Electron. Test. 35(2): 163-172 (2019)
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