"Fault-based ATPG for linear analog circuits with minimal size ..."

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois (1996)

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DOI: 10.1007/BF00137564

access: closed

type: Journal Article

metadata version: 2020-09-11

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Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electron. Test. 9(1-2): 43-57 (1996)

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