"IDDQ Testing of Submicron CMOS - by Cooling?"

Márta Rencz et al. (2000)

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DOI: 10.1023/A:1008364515030

access: closed

type: Journal Article

metadata version: 2022-10-02

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Márta Rencz, Vladimír Székely, S. Török, Kholdoun Torki, Bernard Courtois:
IDDQ Testing of Submicron CMOS - by Cooling? J. Electron. Test. 16(5): 453-461 (2000)

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