"Impact of Annealing Ambience on Resistive Switching in ..."

Guobin Wei et al. (2011)

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DOI: 10.1587/TRANSELE.E94.C.699

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/WeiGOMMHM11
Guobin Wei, Yuta Goto, Akio Ohta, Katsunori Makihara, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Impact of Annealing Ambience on Resistive Switching in Pt/TiO₂/Pt Structure. IEICE Trans. Electron. 94-C(5): 699-704 (2011)

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