"A 45-nm Bulk CMOS Embedded SRAM With Improved Immunity Against Process and ..."

Koji Nii et al. (2008)

> Home

Details and statistics

DOI: 10.1109/JSSC.2007.907998

access: closed

type: Journal Article

metadata version: 2020-08-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/NiiYTOIMYITOHSO08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/NiiYTOIMYITOHSO08
Koji Nii, Makoto Yabuuchi, Yasumasa Tsukamoto, Shigeki Ohbayashi, Susumu Imaoka, Hiroshi Makino, Yoshinobu Yamagami, Satoshi Ishikura, Toshio Terano, Toshiyuki Oashi, Keiji Hashimoto, Akio Sebe, Gen Okazaki, Katsuji Satomi, Hironori Akamatsu, Hirofumi Shinohara:
A 45-nm Bulk CMOS Embedded SRAM With Improved Immunity Against Process and Temperature Variations. IEEE J. Solid State Circuits 43(1): 180-191 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.