"Deep open-set recognition for silicon wafer production monitoring."

Luca Frittoli et al. (2022)

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DOI: 10.1016/J.PATCOG.2021.108488

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type: Journal Article

metadata version: 2022-10-02

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Luca Frittoli, Diego Carrera, Beatrice Rossi, Pasqualina Fragneto, Giacomo Boracchi:
Deep open-set recognition for silicon wafer production monitoring. Pattern Recognit. 124: 108488 (2022)

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