"Modeling and analysis of loading effect on leakage of nanoscaled bulk-CMOS ..."

Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy (2006)

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DOI: 10.1109/TCAD.2005.855934

access: closed

type: Journal Article

metadata version: 2024-05-07

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Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy:
Modeling and analysis of loading effect on leakage of nanoscaled bulk-CMOS logic circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(8): 1486-1495 (2006)

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