"A new symbolic method for analog circuit testability evaluation."

Giulio Fedi et al. (1998)

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DOI: 10.1109/19.744205

access: closed

type: Journal Article

metadata version: 2023-08-28

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Giulio Fedi, Antonio Luchetta, Stefano Manetti, Maria Cristina Piccirilli:
A new symbolic method for analog circuit testability evaluation. IEEE Trans. Instrum. Meas. 47(2): 554-565 (1998)

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