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Neha Gupta 0003
Person information
- affiliation: Delhi Technological University, Microelectronics Research Lab, India
Other persons with the same name
- Neha Gupta — disambiguation page
- Neha Gupta 0001 — University of Maryland, College Park, MD, USA
- Neha Gupta 0002 — Stanford University, CA, USA (and 1 more)
- Neha Gupta 0004 — University of Nottingham, UK
- Neha Gupta 0005 — Indraprastha Institute of Information Technology, Delhi, India(IIIT-D)
- Neha Gupta 0006 — National Institute of Technology Rourkela, Department of Electronics and Communication Engineering, India
- Neha Gupta 0007 — SGT University, Faculty of Commerce & Management, Gurgaon, India (and 1 more)
- Neha Gupta 0008 — Indira Gandhi Delhi Technical University for Women, New Delhi, India
- Neha Gupta 0009 — University of Warwick, Warwick Institute for the Science of Cities, Coventry, UK
- Neha Gupta 0010 — Manav Rachna International Institute of Research and Studies, Faridabad, India
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2010 – 2019
- 2019
- [c3]Ajay Kumar, Neha Gupta, Madan Mohan Tripathi, Rishu Chaujar:
Non-Quasi-Static Small-Signal Modeling of TGRC MOSFET in Parameter Perspective for RF/Microwave Applications. MOCAST 2019: 1-4 - [c2]Ajay Kumar, Neha Gupta, Samarth Singh, Balark Tiwari, Madan Mohan Tripathi, Rishu Chaujar:
Carbon Nanotube Recessed Channel (CNT-RC) MOSFET for High Linearity/ULSI Applications. TENCON 2019: 2564-2567 - 2016
- [j2]Ajay Kumar, Neha Gupta, Rishu Chaujar:
TCAD RF performance investigation of Transparent Gate Recessed Channel MOSFET. Microelectron. J. 49: 36-42 (2016) - [j1]Neha Gupta, Rishu Chaujar:
Investigation of temperature variations on analog/RF and linearity performance of stacked gate GEWE-SiNW MOSFET for improved device reliability. Microelectron. Reliab. 64: 235-241 (2016) - 2014
- [c1]Neha Gupta, Ajay Kumar, Rishu Chaujar:
Impact of Channel Doping and Gate Length on Small Signal Behaviour of Gate Electrode Workfunction Engineered Silicon Nanowire MOSFET at THz Frequency. ISED 2014: 192-196
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