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ORCIDJürgen Pilz
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2020 – today
- 2022
[j20]Anna Jenul, Stefan Schrunner
, Jürgen Pilz, Oliver Tomic:
A user-guided Bayesian framework for ensemble feature selection in life science applications (UBayFS). Mach. Learn. 111(10): 3897-3923 (2022)- 2021
- [j19]Christina Petschnigg, Markus Spitzner, Lucas Weitzendorf, Jürgen Pilz:
From a Point Cloud to a Simulation Model - Bayesian Segmentation and Entropy Based Uncertainty Estimation for 3D Modelling. Entropy 23(3): 301 (2021) - [j18]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
Flexible time reduction method for burn-in of high-quality products. Qual. Reliab. Eng. Int. 37(6): 2900-2915 (2021) - [j17]Konstantin Posch, Jürgen Pilz:
Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks. IEEE Trans. Neural Networks Learn. Syst. 32(3): 1037-1051 (2021) - [i6]Christina Petschnigg, Markus Spitzner, Lucas Weitzendorf, Jürgen Pilz:
From a Point Cloud to a Simulation Model: Bayesian Segmentation and Entropy based Uncertainty Estimation for 3D Modelling. CoRR abs/2102.02488 (2021) - [i5]Anna Jenul, Stefan Schrunner, Jürgen Pilz, Oliver Tomic:
A User-Guided Bayesian Framework for Ensemble Feature Selection in Life Science Applications (UBayFS). CoRR abs/2104.14787 (2021) - 2020
- [j16]Konstantin Posch, Maximilian Arbeiter, Jürgen Pilz:
A novel Bayesian approach for variable selection in linear regression models. Comput. Stat. Data Anal. 144: 106881 (2020) - [j15]Jan Steinbrener, Konstantin Posch, Jürgen Pilz:
Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational Inference. Sensors 20(21): 6011 (2020) - [j14]Martin Pleschberger, Stefan Schrunner, Jürgen Pilz:
An Explicit Solution for Image Restoration using Markov Random Fields. J. Signal Process. Syst. 92(2): 257-267 (2020) - [i4]Konstantin Posch, Christian Truden, Philipp Hungerländer, Jürgen Pilz:
A Bayesian Approach for Predicting Food and Beverage Sales in Staff Canteens and Restaurants. CoRR abs/2005.12647 (2020) - [i3]Christina Petschnigg, Jürgen Pilz:
Uncertainty Estimation in Deep Neural Networks for Point Cloud Segmentation in Factory Planning. CoRR abs/2012.07038 (2020)
2010 – 2019
- 2019
- [i2]Konstantin Posch, Jan Steinbrener, Jürgen Pilz:
Variational Inference to Measure Model Uncertainty in Deep Neural Networks. CoRR abs/1902.10189 (2019) - [i1]Konstantin Posch, Jürgen Pilz:
Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks. CoRR abs/1904.01334 (2019) - 2018
- [j13]Ran Wang, Jingyu Lin, Bo Zhao, Lu Li, Zhouxuan Xiao, Jürgen Pilz:
Integrated Approach for Lithological Classification Using ASTER Imagery in a Shallowly Covered Region - The Eastern Yanshan Mountain of China. IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens. 11(12): 4791-4807 (2018) - [c12]Dzenana Alagic, Olivia Bluder, Jürgen Pilz:
Quantification and Prediction of Damage in SAM Images of Semiconductor Devices. ICIAR 2018: 490-496 - [c11]Dzenana Alagic, Jürgen Pilz:
Unsupervised Algorithm to Detect Damage Patterns in Microstructure Images of Metal Films. IPAS 2018: 67-72 - 2017
- [c10]Shirin Riazy, Tilo Wendler, Jürgen Pilz, Martin Glos, Thomas Penzel:
Heuristic Approximation of the MAP Estimator for Automatic Two-channel Sleep Staging. BIOSIGNALS 2017: 236-241 - [c9]Michael Ortner, Christian Huber, Natalie Vollert, Jürgen Pilz, Dieter Suess:
Application of 3D-printed magnets for magnetic position detection systems. IEEE SENSORS 2017: 1-3 - 2016
- [j12]Muhammad Mohsin, Jürgen Pilz, Albrecht Gebhardt:
An Explicit Distribution to Model the Proportion of Heating Degree Day and Cooling Degree Day. Commun. Stat. Simul. Comput. 45(7): 2617-2624 (2016) - 2015
- [j11]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
An advanced area scaling approach for semiconductor burn-in. Microelectron. Reliab. 55(1): 129-137 (2015) - [j10]Daniel Kurz, Cristina De Luca, Jürgen Pilz:
A Sampling Decision System for Virtual Metrology in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 12(1): 75-83 (2015) - 2014
- [j9]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
Advanced Bayesian Estimation of Weibull Early Life Failure Distributions. Qual. Reliab. Eng. Int. 30(3): 363-373 (2014) - [j8]Muhammad Mohsin, Hannes Kazianka, Jürgen Pilz, Albrecht Gebhardt:
A new bivariate exponential distribution for modeling moderately negative dependence. Stat. Methods Appl. 23(1): 123-148 (2014) - [j7]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
Decision-Theoretical Model for Failures Which are Tackled by Countermeasures. IEEE Trans. Reliab. 63(2): 583-592 (2014) - [c8]Daniel Kurz, Horst Lewitschnig, Jürgen Pilz:
Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing. WSC 2014: 2600-2608 - [c7]Daniel Kurz, Jürgen Pilz, Andrea Schirru, Simone Pampuri, Cristina De Luca:
A sampling decision system for semiconductor manufacturing: relying on virtual metrology and actual measurements. WSC 2014: 2649-2660 - [c6]Anja Zernig, Olivia Bluder, Jürgen Pilz, Andre Kästner:
Device level maverick screening: detection of risk devices through independent component analysis. WSC 2014: 2661-2670 - [c5]Kathrin Plankensteiner, Olivia Bluder, Jürgen Pilz:
Modeling and prediction of smart power semiconductor lifetime data using a gaussian process prior. WSC 2014: 2671-2681 - 2013
- [j6]Muhammad Mohsin, Hannes Kazianka, Jürgen Pilz:
Likelihood and objective Bayesian modeling of acidity and major ions in rainfall using a bivariate pseudo-Gamma distribution. Comput. Geosci. 54: 269-278 (2013) - [c4]Daniel Kurz, Cristina De Luca, Jürgen Pilz:
Monitoring virtual metrology reliability in a sampling decision system. CASE 2013: 20-25 - 2012
- [c3]Daniel Kurz, Cristina De Luca, Jürgen Pilz:
Sampling Decision System in semiconductor manufacturing using Virtual Metrology. CASE 2012: 74-79 - 2011
- [j5]Grégoire Dubois, Dan Cornford, Dionissios T. Hristopulos, Edzer J. Pebesma, Jürgen Pilz:
Introduction to this special issue on geoinformatics for environmental surveillance. Comput. Geosci. 37(3): 277-279 (2011) - [j4]O. P. Baume, Albrecht Gebhardt, C. Gebhardt, Gerard B. M. Heuvelink, Jürgen Pilz:
Network optimization algorithms and scenarios in the context of automatic mapping. Comput. Geosci. 37(3): 289-294 (2011) - [j3]Hannes Kazianka, Jürgen Pilz:
Bayesian spatial modeling and interpolation using copulas. Comput. Geosci. 37(3): 310-319 (2011) - [j2]Edzer J. Pebesma, Dan Cornford, Grégoire Dubois, Gerard B. M. Heuvelink, Dionissios T. Hristopulos, Jürgen Pilz, Ulrich Stöhlker, Gary Morin, Jon O. Skøien:
INTAMAP: The design and implementation of an interoperable automated interpolation web service. Comput. Geosci. 37(3): 343-352 (2011) - [j1]Olivia Bluder, Michael Glavanovics, Jürgen Pilz:
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability. Microelectron. Reliab. 51(9-11): 1464-1468 (2011) - [c2]Daniel Kurz, Johannes Kaspar, Jürgen Pilz:
Dynamic Maintenance in semiconductor manufacturing using Bayesian networks. CASE 2011: 238-243 - [r4]Gunter Spöck, Jürgen Pilz:
Analysis of Areal and Spatial Interaction Data. International Encyclopedia of Statistical Science 2011: 35-39 - [r3]Hannes Kazianka, Jürgen Pilz:
Model-Based Geostatistics. International Encyclopedia of Statistical Science 2011: 833-836 - [r2]Jürgen Pilz:
Spatial Statistics. International Encyclopedia of Statistical Science 2011: 1363-1368 - [r1]Jürgen Pilz:
Statistical Design of Experiments (DOE). International Encyclopedia of Statistical Science 2011: 1392-1396
2000 – 2009
- 2007
- [c1]Hannes Kazianka, Raimund Leitner, Jürgen Pilz:
Segmentation and Classification of Hyper-Spectral Skin Data. GfKl 2007: 245-252
Coauthor Index
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