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ORCIDHans Martin von Staudt
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2020 – today
- 2022
[c12]Hans Martin von Staudt, Luai Tarek Elnawawy, Sarah Wang, Larry Ping, Jung Woo Choi:
Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC. ITC 2022: 365-371- [c11]Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo:
IEEE P1687.1: Extending the Network Boundaries for Test. ITC 2022: 382-390 - [c10]Hans Martin von Staudt, Franz Schuler, Rohitaswa Bhattacharya, Justin Wei-Lin Cheng, Cheng-Da Huang, Parker Chih-Chun Chen:
High-Coverage DfT and Reliability Enhancements for Automotive Floating Gate OTP Beyond AEC-Q100. ITC 2022: 637-641 - 2021
- [c9]Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim:
Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. ETS 2021: 1-10 - 2020
- [c8]Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick:
Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC 2020: 1-10 - [c7]Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne:
Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices. ITC 2020: 1-10
2010 – 2019
- 2019
- [c6]Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt:
Innovative Practices on IEEE 1687.xyz. VTS 2019: 1 - [c5]Hans Martin von Staudt, Amit Majumdar, Bill Taylor, Jennifer Kitchen:
Innovative Design for Test in State-of-the-Art Analog Systems. VTS 2019: 1 - 2017
- [c4]Michael Laisne, Hans Martin von Staudt, Sourabh Bhalerao, Mark Eason:
Single-pin test control for Big A, little D devices. ITC 2017: 1-10
2000 – 2009
- 2007
- [c3]Oliver Spang, Hans Martin von Staudt, Michael G. Wahl:
A sophisticated memory test engine for LCD display drivers. DATE 2007: 213-218 - 2006
- [c2]Stefan Vock, Ulrich Flogaus, Hans Martin von Staudt:
Productivity and Code Quality Improvement of Mixed-Signal Test Software by Applying Software Engineering Methods. DDECS 2006: 136-140 - [c1]Stefan Vock, Markus Schmid, Hans Martin von Staudt:
Test Software Generation Productivity and Code Quality Improvement by applying Software Engineering Techniques. ITC 2006: 1-8
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