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Alexey Vert

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2020 – today

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2020
[c2]
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  dblp key:
  - conf/natw/RauchLVG20
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Stewart E. Rauch, Dongho Lee, Alexey Vert, Roy Gupta:
Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics. NATW 2020: 1-4
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  - conf/ofc/RauchLVJM30
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Stewart E. Rauch, Dongho Lee, Alexey Vert, Lin Jiang, Byoung Min:
Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics. OFC 2020: 1-3

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