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ORCIDRafael Perez Martinez
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2020 – today
- 2024
[j1]Rafael Perez Martinez
, Masaya Iwamoto, Kelly Woo, Zhengliang Bian, Roberto Tinti, Stephen P. Boyd, Srabanti Chowdhury:
Compact Model Parameter Extraction via Derivative-Free Optimization. IEEE Access 12: 123224-123235 (2024)- [i3]Rafael Perez Martinez, Masaya Iwamoto, Kelly Woo, Zhengliang Bian, Roberto Tinti, Stephen P. Boyd, Srabanti Chowdhury:
Compact Model Parameter Extraction via Derivative-Free Optimization. CoRR abs/2406.16355 (2024) - [i2]Rafael Perez Martinez, Stephen P. Boyd, Srabanti Chowdhury:
Robust Pareto Design of GaN HEMTs for Millimeter-Wave Applications. CoRR abs/2406.17337 (2024) - 2022
- [c5]Bhawani Shankar, Ke Zeng, Brendan Gunning, Rafael Perez Martinez, Chuanzhe Meng, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar, Srabanti Chowdhury:
Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress. DRC 2022: 1-2 - [c4]Bhawani Shankar, Zhengliang Bian, Ke Zeng, Chuanzhe Meng, Rafael Perez Martinez, Srabanti Chowdhury, Brendan Gunning, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar:
Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization. IRPS 2022: 2 - [i1]Faraz Waseem, Rafael Perez Martinez, Chris Wu:
Visual anomaly detection in video by variational autoencoder. CoRR abs/2203.03872 (2022) - 2020
- [c3]Arya Moradinia, Rafael Perez Martinez, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, Harrison Lee, John D. Cressler:
Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver. BCICTS 2020: 1-5
2010 – 2019
- 2019
- [c2]Rafael Perez Martinez, Uppili S. Raghunathan, Brian R. Wier, Harrison P. Lee, John D. Cressler:
Reliability Differences Between SiGe HBTs Optimized for High-Performance and Medium-Breakdown. BCICTS 2019: 1-4 - 2018
- [c1]Brian R. Wier, Rafael Perez Martinez, Uppili S. Raghunathan, Hanbin Ying, Saeed Zeinolabedinzadeh, John D. Cressler:
Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design. BCICTS 2018: 215-218
Coauthor Index
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