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ORCIDFrédéric Wrobel
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2020 – today
- 2023
[c16]Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra
, Paulo F. Butzen, Cristina Meinhardt:
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. SBCCI 2023: 1-6- 2022
- [c15]Lucas Matana Luza, Frederic Wrobel, Luis Entrena, Luigi Dilillo:
Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices. ETS 2022: 1-10 - 2020
- [c14]S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul:
Effect of Temperature on Single Event Latchup Sensitivity. DTIS 2020: 1-5 - [c13]Georgios Tsiligiannis, Antoine D. Touboul, Gaëtan Bricas, Tadec Maraine, Jerome Boch, Frederic Wrobel, Alain Michez, Frédéric Saigné, Alain Godot, Asenath Etile, Thibaud Durand, Romain Sueur, Didier Farigoule, Philippe Girones:
Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning. DTIS 2020: 1-6 - [c12]Israel C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed:
Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. LATS 2020: 1-6
2010 – 2019
- 2018
- [j7]Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget:
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. 88-90: 920-924 (2018) - [j6]Hoang T. Nguyen, Axel Rodriguez, Frederic Wrobel, Alain Michez, Francoise Bezerra, Nathalie Chatry, Benjamin Vandevelde:
TCAD simulation of radiation-induced leakage current in 1T1C SDRAM. Microelectron. Reliab. 88-90: 974-978 (2018) - 2017
- [j5]Frederic Wrobel, Antoine D. Touboul, Vincent Pouget, Luigi Dilillo, Jerome Boch, Frédéric Saigné:
A calculation method to estimate single event upset cross section. Microelectron. Reliab. 76-77: 644-649 (2017) - [j4]Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné:
Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. Microelectron. Reliab. 76-77: 650-654 (2017) - 2015
- [c11]Luigi Dilillo, Alexandre Bosser, Viyas Gupta, Frederic Wrobel, Frédéric Saigné:
Real-time SRAM based particle detector. IWASI 2015: 58-62 - 2013
- [c10]Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné:
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell. DFTS 2013: 143-148 - [c9]Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné:
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations. IOLTS 2013: 145-150 - [c8]Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné:
Characterization of an SRAM based particle detector for mixed-field radiation environments. IWASI 2013: 75-80 - 2012
- [j3]Antoine D. Touboul, L. Foro, Frederic Wrobel, Frédéric Saigné:
On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum. Microelectron. Reliab. 52(1): 124-129 (2012) - [c7]Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné:
Evaluation of test algorithms stress effect on SRAMs under neutron radiation. IOLTS 2012: 121-122 - 2011
- [j2]Frederic Wrobel, Frédéric Saigné:
MC-ORACLE: A tool for predicting Soft Error Rate. Comput. Phys. Commun. 182(2): 317-321 (2011) - [c6]Luigi Dilillo, Paolo Rech, Jean-Marc Gallière, Patrick Girard, Frederic Wrobel, Frédéric Saigné:
Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench. LATW 2011: 1-6 - 2010
- [c5]Frédéric Wrobel:
Manufacturers to end-users tools for radiations induced reliability issues in electronic devices. LATW 2010: 1
2000 – 2009
- 2008
- [j1]Frederic Wrobel:
Detailed history of recoiling ions induced by nucleons. Comput. Phys. Commun. 178(2): 88-104 (2008) - 2007
- [c4]Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard:
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. IOLTS 2007: 137-145 - 2006
- [c3]Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard:
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS 2006: 63-74 - 2005
- [c2]Frederic Wrobel:
Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics. IOLTS 2005: 82-86 - [c1]Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard:
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. IOLTS 2005: 87-94
Coauthor Index
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