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ORCIDPhilippe Cauvet
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2010 – 2019
- 2017
[j10]Anthony Deluthault, Vincent Kerzerho, Serge Bernard
, Fabien Soulier, Philippe Cauvet:
New Calibration Technique of Contact-less Resonant Biosensor. J. Electron. Test. 33(3): 365-375 (2017)- [j9]Anthony Deluthault, Luc Mezenge, Philippe Cauvet, Vincent Kerzerho, Fabien Soulier, Serge Bernard:
Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device. J. Sensors 2017: 8436123:1-8436123:9 (2017) - 2014
- [c9]Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos:
Solutions for the self-adaptation of communicating systems in operation. IOLTS 2014: 234-239 - 2011
- [j8]Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell:
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electron. Test. 27(3): 335-350 (2011)
2000 – 2009
- 2009
- [c8]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
A multi-converter DFT technique for complex SIP: Concepts and validation. ECCTD 2009: 747-750 - 2008
- [j7]Emmanuel Simeu, Hoang Nam Nguyen, Philippe Cauvet, Salvador Mir, Libor Rufer, Rafik Khereddine:
Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing. VLSI Design 2008: 294014:1-294014:10 (2008) - [j6]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib:
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: 482159:1-482159:8 (2008) - [c7]Erdem Serkan Erdogan, Sule Ozev, Philippe Cauvet:
Diagnosis of assembly failures for System-in-Package RF tuners. ISCAS 2008: 2286-2289 - [c6]Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, David Andreu, Serge Bernard:
Wireless Test Structure for Integrated Systems. ITC 2008: 1 - 2007
- [j5]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Comput. Digit. Tech. 1(3): 146-153 (2007) - [c5]Philippe Cauvet, Serge Bernard, Michel Renovell:
System-in-Package, a Combination of Challenges and Solutions. ETS 2007: 193-199 - [c4]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2007: 211-216 - [c3]Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky:
High throughput non-contact SiP testing. ITC 2007: 1-10 - 2006
- [j4]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Des. Test Comput. 23(3): 234-243 (2006) - [j3]Vincent Kerzerho, Serge Bernard, Philippe Cauvet, Jean-Marie Janik:
A First Step for an INL Spectral-Based BIST: The Memory Optimization. J. Electron. Test. 22(4-6): 351-357 (2006) - [c2]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2006: 159-164 - [c1]Vincent Fresnaud, Lilian Bossuet, Dominique Dallet, Serge Bernard, Jean-Marie Janik, B. Agnus, Philippe Cauvet, Ph. Gandy:
A Low Cost Alternative Method for Harmonics Estimation in a BIST Context. ETS 2006: 193-198 - 2001
- [j2]Philippe Cauvet:
Erratum to "Improving the dynamic measurements of ADC's using the 2-ADC method" [Computer standard and interfaces vol. 22 issue 4, 281-286]. Comput. Stand. Interfaces 23(3): 237 (2001) - [j1]Philippe Cauvet:
Erratum to "Improving the dynamic measurements of ADCs using the 2-ADC method" [Computer standard and interfaces vol. 22 issue 4, 281-286]. Comput. Stand. Interfaces 23(3): 239-243 (2001)
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