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ORCIDKan Takeuchi
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2010 – 2019
- 2019
[c10]Kan Takeuchi, Masaki Shimada, Shinya Konishi, Daisuke Oshida, Naoya Ota, Takashi Yasumasu, Koji Shibutani, Tomohiro Iwashita, Tetsuya Kokubun, Fumio Tsuchiya:
Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance. IRPS 2019: 1-7- 2018
- [j6]Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya:
Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. IET Circuits Devices Syst. 12(2): 182-188 (2018) - 2017
- [c9]Mitsuhiko Igarashi, Yoshio Takazawa, Yasumasa Tsukamoto, Kan Takeuchi, Koji Shibutani:
NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator. A-SSCC 2017: 201-204 - 2016
- [c8]Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya:
FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. ESSCIRC 2016: 265-268 - 2015
- [c7]Mitsuhiko Igarashi
, Kan Takeuchi, Takeshi Okagaki, Koji Shibutani, Hiroaki Matsushita, Koji Nii:
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology. ESSCIRC 2015: 112-115 - 2014
- [c6]Mitsuhiko Igarashi, Hideki Aono, Hideaki Abe, Koji Shibutani, Kan Takeuchi:
Assessment of reliability impact on GHz processors with moderate overdrive. ISQED 2014: 456-460 - 2013
- [j5]Kan Takeuchi, Masaki Shimada, Takao Sato, Yusaku Katsuki, Hiroumi Yoshikawa, Hiroaki Matsushita:
Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise. IEEE Trans. Very Large Scale Integr. Syst. 21(1): 164-168 (2013) - 2012
- [c5]Mitsuhiko Igarashi, Kan Takeuchi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita:
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization. CICC 2012: 1-4 - 2011
- [j4]Kan Takeuchi:
Non-parametric test of time consistency: Present bias and future bias. Games Econ. Behav. 71(2): 456-478 (2011) - 2010
- [j3]Yan Chen, Kan Takeuchi:
Multi-object auctions with package bidding: An experimental comparison of Vickrey and iBEA. Games Econ. Behav. 68(2): 557-579 (2010)
2000 – 2009
- 2008
- [j2]Kan Takeuchi, Atsushi Yoshikawa, Michio Komoda, Ken Kotani, Hiroaki Matsushita, Yusaku Katsuki, YuyoYamamoto, Takao Sato:
Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. IEEE Trans. Very Large Scale Integr. Syst. 16(11): 1559-1566 (2008) - [c4]Genichi Tanaka, Kan Takeuchi, Minoru Ito, Hiroaki Matsushita:
A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process. CICC 2008: 37-40 - [c3]Kan Takeuchi, Genichi Tanaka, Hiroaki Matsushita, Kenichi Yoshizumi, Yusaku Katsuki, Takao Sato:
Observations of Supply-Voltage-Noise Dispersion in Sub-nsec. ITC 2008: 1-8 - 2007
- [c2]Kan Takeuchi, John Lin, Yan Chen, Thomas A. Finholt:
Shake it up baby: scheduling with package auctions. EC 2007: 113 - 2004
- [j1]Kan Takeuchi, Kazumasa Yanagisawa, Takashi Sato, Kazuko Sakamoto, Saburo Hojo:
Probabilistic crosstalk delay estimation for ASICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(9): 1377-1383 (2004) - [c1]Xiuqin Chen, Shaoming Yang, M. Hasegawa, Kan Takeuchi, K. Kawabe, Seiji Motojima:
Novel Tactile Sensors Manufactured by Carbon Microcoils. ICMENS 2004: 486-491
Coauthor Index
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