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ORCIDMatroni Koutsoureli
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2010 – 2019
- 2018
[j15]Dimitrios Birmpiliotis, Matroni Koutsoureli, J. Kohylas, George J. Papaioannou
, A. Ziaei:
Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches. Microelectron. Reliab. 88-90: 840-845 (2018)- 2017
- [j14]Matroni Koutsoureli, George Stavrinidis, Dimitrios Birmpiliotis, George Konstantinidis, George J. Papaioannou:
Electrical properties of SiNx films with embedded CNTs for MEMS capacitive switches. Microelectron. Reliab. 76-77: 614-618 (2017) - [j13]Matroni Koutsoureli, N. Siannas, George J. Papaioannou:
Temperature accelerated discharging processes through the bulk of PECVD silicon nitride films for MEMS capacitive switches. Microelectron. Reliab. 76-77: 631-634 (2017) - 2016
- [j12]Matroni Koutsoureli, Athanasios Zevgolatis, Samuel Saada, Christine Mer-Calfati, Loukas Michalas, George J. Papaioannou, Philippe Bergonzo:
Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness. Microelectron. Reliab. 64: 660-664 (2016) - [j11]Matroni Koutsoureli, Dimitrios Birmpiliotis, Loukas Michalas, George J. Papaioannou:
An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches. Microelectron. Reliab. 64: 688-692 (2016) - 2015
- [j10]Loukas Michalas, Matroni Koutsoureli, E. Papandreou, Flavio Giacomozzi, George J. Papaioannou:
Dielectric charging effects in floating electrode MEMS capacitive switches. Microelectron. Reliab. 55(9-10): 1891-1895 (2015) - [j9]Matroni Koutsoureli, Loukas Michalas, E. Papandreou, George J. Papaioannou:
Induced charging phenomena on SiNx dielectric films used in RF MEMS capacitive switches. Microelectron. Reliab. 55(9-10): 1911-1915 (2015) - [c1]Panagiotis Giounanlis, Elena Blokhina, Orla Feely, Loukas Michalas, Matroni Koutsoureli, George J. Papaioannou:
Modelling of the dynamical behaviour of floating electrode MEMS. ISCAS 2015: 1322-1325 - 2014
- [j8]Matroni Koutsoureli, Loukas Michalas, Anestis Gantis, George J. Papaioannou:
A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches. Microelectron. Reliab. 54(9-10): 2159-2163 (2014) - 2013
- [j7]Matroni Koutsoureli, Loukas Michalas, P. Martins, E. Papandreou, A. Leuliet, S. Bansropun, George J. Papaioannou, A. Ziaei:
Properties of contactless and contacted charging in MEMS capacitive switches. Microelectron. Reliab. 53(9-11): 1655-1658 (2013) - 2012
- [j6]Matroni Koutsoureli, Loukas Michalas, George J. Papaioannou:
Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches. Microelectron. Reliab. 52(9-10): 2240-2244 (2012) - [j5]Loukas Michalas, Anurag Garg, Ayyaswamy Venkattraman, Matroni Koutsoureli, Alina A. Alexeenko, Dimitrios Peroulis, George J. Papaioannou:
A study of field emission process in electrostatically actuated MEMS switches. Microelectron. Reliab. 52(9-10): 2267-2271 (2012) - [j4]Loukas Michalas, Anastasia Syntychaki, Matroni Koutsoureli, George J. Papaioannou, Apostolos T. Voutsas:
A temperature study of photosensitivity in SLS polycrystalline silicon TFTs. Microelectron. Reliab. 52(9-10): 2508-2511 (2012) - 2011
- [j3]Matroni Koutsoureli, George J. Papaioannou:
Determination of bulk discharge current in the dielectric film of MEMS capacitive switches. Microelectron. Reliab. 51(9-11): 1874-1877 (2011) - 2010
- [j2]Usama Zaghloul, Matroni Koutsoureli, H. Wang, Fabio Coccetti, George J. Papaioannou, Patrick Pons, Robert Plana:
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectron. Reliab. 50(9-11): 1615-1620 (2010)
2000 – 2009
- 2008
- [j1]Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana:
Alpha particle radiation effects in RF MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1241-1244 (2008)
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