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Sebastien Jan
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2020 – today
- 2024
- [j2]Geoffrey Daniel, Mohamed Bahi Yahiaoui, Claude Comtat, Sebastien Jan, Olga Kochebina, Jean-Marc Martinez, Viktoriya Sergeyeva, Viatcheslav Sharyy, Chi-Hsun Sung, Dominique Yvon:
Deep learning reconstruction with uncertainty estimation for γ photon interaction in fast scintillator detectors. Eng. Appl. Artif. Intell. 131: 107876 (2024) - 2023
- [i1]Geoffrey Daniel, Mohamed Bahi Yahiaoui, Claude Comtat, Sebastien Jan, Olga Kochebina, Jean-Marc Martinez, Viktoriya Sergeyeva, Viatcheslav Sharyy, Chi-Hsun Sung, Dominique Yvon:
Deep Learning reconstruction with uncertainty estimation for γ photon interaction in fast scintillator detectors. CoRR abs/2310.06572 (2023) - 2022
- [c4]Stéphane Monfray, Sylvain Guerber, Aude Montagné, Daivid Fowler, Philippe Grosse, Jonathan Planchot, Delia Ristoiu, Fabrice Baron, Melissa Brihoum, Laurene Babaud, Arnaud Taute, Eva Kempf, Karine Rovayaz, Paul Chantraine, Sylvie Delmedico, François Leverd, Lionel Balme, Denis Pellissier, Katia Haxaire, Marc Guillermet, Sebastien Mermoz, Metig Hello, Sebastien Jan, Pascal Chevalier, Frédéric Boeuf:
Optical Phased Array for 905-nm LIDAR applications integrated on 300mm Si-Photonic Platform. OFC 2022: 1-3
2010 – 2019
- 2015
- [c3]Frédéric Boeuf, Sebastien Cremer, Enrico Temporiti, Massimo Fere, Mark Shaw, Nathalie Vulliet, Bastien Orlando, Delia Ristoiu, Alexis Farcy, Thierry Pinguet, Attila Mekis, Gianlorenzo Masini, Peng Sun, Yuemeng Chi, Herve Petiton, Sebastien Jan, Jean-Robert Manouvrier, Charles Baudot, Patrick Le Maitre, Jean Francois Carpentier, Laurent Salager, Matteo Traldi, Luca Maggi, Danilo Rigamonti, Chiara Zaccherini, Carolina Elemi, Bernard Sautreuil, Luigi Verga:
Recent progress in Silicon Photonics R&D and manufacturing on 300mm wafer platform. OFC 2015: 1-3 - 2013
- [c2]Florence Sonnerat, Romain Pilard, Frederic Gianesello, Sebastien Jan, François Le Pennec, Christian Person, Cedric Durand, Daniel Gloria:
30 dBm P1dB and 4 dB insertion losses optimized 4G antenna tuner fully integrated in a 130 nm CMOS SOI technology. RWS 2013: 73-75 - 2012
- [j1]Laurent Negre, David Roy, Florian Cacho, Patrick Scheer, Sebastien Jan, Samuel Boret, Daniel Gloria, Gérard Ghibaudo:
Reliability Characterization and Modeling Solution to Predict Aging of 40-nm MOSFET DC and RF Performances Induced by RF Stresses. IEEE J. Solid State Circuits 47(5): 1075-1083 (2012) - [c1]Benjamin Dormieu, Patrick Scheer, Clement Charbuillet, Sebastien Jan, François Danneville:
4-Port isolated MOS modeling and extraction for mmW applications. ESSCIRC 2012: 38-41
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last updated on 2024-10-07 21:17 CEST by the dblp team
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