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Jeanne Bickford

Jeanne P. Bickford

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2010 – 2019

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2010
[c3]
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  - conf/isqed/BickfordHGMJK10
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Jeanne Bickford, Nazmul Habib, John Goss, Robert McMahon, Rajiv V. Joshi, Rouwaida Kanj:
Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test. ISQED 2010: 315-319

2000 – 2009

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2006
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Markus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, Ralf Sommer, Michael Pronath, Andreas Ripp:
DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design. DATE 2006: 387-392
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Jeanne Bickford, Jason Hibbeler, Markus Bühler, Jürgen Koehl, Dirk Müller, Sven Peyer, Christian Schulte:
Yield Improvement by Local Wiring Redundancy. ISQED 2006: 473-478

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