"Automatic Generation of Memory Built-in Self-Test Cores for System-on-Chip."

Kuo-Liang Cheng et al. (2001)

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DOI: 10.1109/ATS.2001.990265

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kuo-Liang Cheng, Chia-Ming Hsueh, Jing-Reng Huang, Jen-Chieh Yeh, Chih-Tsun Huang, Cheng-Wen Wu:
Automatic Generation of Memory Built-in Self-Test Cores for System-on-Chip. Asian Test Symposium 2001: 91-96

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