"A Test Cost Reduction Method by Test Response and Test Vector Overlapping ..."

Tsuyoshi Shinogi et al. (2005)

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DOI: 10.1109/ATS.2005.17

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tsuyoshi Shinogi, Hiroyuki Yamada, Terumine Hayashi, Shinji Tsuruoka, Tomohiro Yoshikawa:
A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture. Asian Test Symposium 2005: 366-371

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