"Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and ..."

Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich (2007)

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DOI: 10.1109/DDECS.2007.4295278

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich:
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. DDECS 2007: 185-190

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