"Standard Cell Layout Regularity and Pin Access Optimization Considering ..."

Wei Ye et al. (2015)

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DOI: 10.1145/2742060.2742084

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-28

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Wei Ye, Bei Yu, David Z. Pan, Yongchan Ban, Lars Liebmann:
Standard Cell Layout Regularity and Pin Access Optimization Considering Middle-of-Line. ACM Great Lakes Symposium on VLSI 2015: 289-294

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