"An Information Retrieval System for the Analysis of Systematic Defects in ..."

David L. DeMaris et al. (2004)

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DOI: 10.1109/ICTAI.2004.31

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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David L. DeMaris, Dan Maynard, Bette Bergman Reuter, Shi Zhong:
An Information Retrieval System for the Analysis of Systematic Defects in VLSI. ICTAI 2004: 216-223

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