"Vertical stack reliability of GaN-on-Si buffers for low-voltage applications."

Elena Fabris et al. (2021)

> Home

Details and statistics

DOI: 10.1109/IRPS46558.2021.9405097

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/FabrisBPZJYDMMZ21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/FabrisBPZJYDMMZ21
Elena Fabris, Matteo Borga, Niels Posthuma, Ming Zhao, Brice De Jaeger, Shuzhen You, Stefaan Decoutere, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni:
Vertical stack reliability of GaN-on-Si buffers for low-voltage applications. IRPS 2021: 1-8

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.