"Stochastic Edge Detection for Fine-Grained Progressive Precision."

Youngwook Lee et al. (2021)

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DOI: 10.1109/ISOCC53507.2021.9614036

access: closed

type: Conference or Workshop Paper

metadata version: 2022-02-01

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Youngwook Lee, Kyung Ki Kim, Yong-Bin Kim, Minsu Choi:
Stochastic Edge Detection for Fine-Grained Progressive Precision. ISOCC 2021: 119-120

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